X-Ray Diffraction Analysis
X-Ray diffraction analysis measures atomic spacing in crystals using diffraction of approximately monochromatic x-ray radiation.
X-Ray diffraction analysis can provide:
- Identification and characterization of powders, thin films, single crystals, polycrystalline and amorphous materials.
- Phase identification/quantification.
- Crystallinity determination.
- Structure determination and refinement.
- Measurements under non-ambient conditions.
Lorad’s expertise combined with our state-of-the-art instrumentation is a proven and cost-effective analytical service to provide solutions to your testing challenges. Whether you need a single sample analyzed or are looking to outsource all your XRD analytical testing, Lorad has options for you. We employ a team of scientists, engineers, and technicians that have a broad range of manufacturing and product development experience. Our team has the practical experience characterizing materials to assist in any XRD related troubleshooting.
Lorad is sensitive to the concerns of our customers that their rights in the samples are protected. Lorad has standard non-disclosure agreements, confidentiality agreements, reservation of patent and ownership rights agreements, which our customers may use. Alternatively, the customer may choose to provide their own agreements. Lorad is committed to protecting the privacy and intellectual property rights of our customers as we work along side them. If the customer wishes, we can ship the samples back to the customer or destroy the samples on-site.
To request x-ray diffraction analysis for your samples, submit a request below.
|Number of Samples||Turn Around Time*||Price|
|3 or less samples||2-3 business days||$75.00 USD per sample|
|4–10 samples||2-3 business days||$65.00 USD per sample|
|11–20 samples||4-5 business days||$55.00 USD per sample|
|>20 samples||variable business days||$45.00 USD per sample|